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1 Ergebnisse
1
No Trouble Found (NTF) Customer Return Analysis:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Tran, Thong
;
Gundala, Sudheer Reddy
;
Soni, Komal
... - p. 1-6 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129635
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>No Trouble Found (NTF) Customer Return Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9129635&Exemplar=1&LAN=DE A1 Tran, Thong A1 Gundala, Sudheer Reddy A1 Soni, Komal A1 Baker, Aaron A1 Fogle, Adam A1 Chandrashekhar, Sandhya YR 2020 SN 1938-1891 K1 Field returns K1 No trouble found K1 Product reliability K1 Semiconductor device testing K1 Statistical analysis SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129635 DO https://doi.org/10.1109/IRPS45951.2020.9129635 SF ELIB - SuUB Bremen
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