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1 Ergebnisse
1
Investigating of SER in 28 nm FDSOI-Planar and Comparing wi..:
, In:
2020 IEEE International Reliability Physics Symposium (IRPS)
,
Uemura, Taiki
;
Chung, Byungjin
;
Jo, Jeongmin
... - p. 1-5 , 2020
Link:
https://doi.org/10.1109/IRPS45951.2020.9129644
RT T1 <cTitle>2020 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9129644&Exemplar=1&LAN=DE A1 Uemura, Taiki A1 Chung, Byungjin A1 Jo, Jeongmin A1 Jiang, Hai A1 Ji, Yongsung A1 Jeong, Tae-Young A1 Ranjan, Rakesh A1 Park, Youngin A1 Hong, Kiil A1 Lee, Seungbae A1 Rhee, Hwasung A1 Pae, Sangwoo A1 Lee, Euncheol A1 Choi, Jaehee A1 Ohnishi, Shota A1 Machida, Ken YR 2020 SN 1938-1891 K1 Soft error K1 Single event K1 TID K1 SEU K1 SET SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS45951.2020.9129644 DO https://doi.org/10.1109/IRPS45951.2020.9129644 SF ELIB - SuUB Bremen
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