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Assessment Study of Aging Life for Typical Defects in XLPE ..:
, In:
2020 3rd International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE)
,
Sun, Changhai
;
Wang, Chunfeng
- p. 772-777 , 2020
Link:
https://doi.org/10.1109/AEMCSE50948.2020.00169
RT T1 <cTitle>2020 3rd International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE)</cTitle>: T1 <Title>Assessment Study of Aging Life for Typical Defects in XLPE Cable Joints</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9131132&Exemplar=1&LAN=DE A1 Sun, Changhai A1 Wang, Chunfeng YR 2020 K1 component K1 XLPE cable K1 typical defect K1 Arrhenius equation K1 life index SP 772 OP 777 LK http://dx.doi.org/https://doi.org/10.1109/AEMCSE50948.2020.00169 DO https://doi.org/10.1109/AEMCSE50948.2020.00169 SF ELIB - SuUB Bremen
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