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1 Ergebnisse
1
Superior subthreshold slope of gate-all-around (GAA) p-type..:
, In:
2020 IEEE Silicon Nanoelectronics Workshop (SNW)
,
Ahn, Min-Ju
;
Saraya, Takuya
;
Kobayashi, Masaharu
. - p. 55-56 , 2020
Link:
https://doi.org/10.1109/SNW50361.2020.9131416
RT T1
2020 IEEE Silicon Nanoelectronics Workshop (SNW)
: T1
Superior subthreshold slope of gate-all-around (GAA) p-type poly-Si junctionless nanowire transistors with highly suppressed grain boundary defects
UL https://suche.suub.uni-bremen.de/peid=ieee-9131416&Exemplar=1&LAN=DE A1 Ahn, Min-Ju A1 Saraya, Takuya A1 Kobayashi, Masaharu A1 Hiramoto, Toshiro YR 2020 SN 2161-4644 SP 55 OP 56 LK http://dx.doi.org/https://doi.org/10.1109/SNW50361.2020.9131416 DO https://doi.org/10.1109/SNW50361.2020.9131416 SF ELIB - SuUB Bremen
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