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1 Ergebnisse
1
Crystallinity Effect on Reliability of Sidewall Damascened ..:
, In:
2020 IEEE Silicon Nanoelectronics Workshop (SNW)
,
Shen, Chuan-Hui
;
Chen, Wei-Yen
;
Chung, Chun-Chih
.. - p. 53-54 , 2020
Link:
https://doi.org/10.1109/SNW50361.2020.9131624
RT T1
2020 IEEE Silicon Nanoelectronics Workshop (SNW)
: T1
Crystallinity Effect on Reliability of Sidewall Damascened Nanowire Poly-Si GAA FETs
UL https://suche.suub.uni-bremen.de/peid=ieee-9131624&Exemplar=1&LAN=DE A1 Shen, Chuan-Hui A1 Chen, Wei-Yen A1 Chung, Chun-Chih A1 Huang, Yu-En A1 Chao, Tien-Sheng YR 2020 SN 2161-4644 K1 Crystallinity K1 GAA K1 nanowire K1 poly-Si K1 reliability SP 53 OP 54 LK http://dx.doi.org/https://doi.org/10.1109/SNW50361.2020.9131624 DO https://doi.org/10.1109/SNW50361.2020.9131624 SF ELIB - SuUB Bremen
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