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1 Ergebnisse
1
Fault Attack Detection in AES by Monitoring Power Side-Chan..:
, In:
2020 21st International Symposium on Quality Electronic Design (ISQED)
,
Shylendra, Ahish
;
Shukla, Priyesh
;
Bhunia, Swarup
. - p. 219-224 , 2020
Link:
https://doi.org/10.1109/ISQED48828.2020.9136981
RT T1 <cTitle>2020 21st International Symposium on Quality Electronic Design (ISQED)</cTitle>: T1 <Title>Fault Attack Detection in AES by Monitoring Power Side-Channel Statistics</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9136981&Exemplar=1&LAN=DE A1 Shylendra, Ahish A1 Shukla, Priyesh A1 Bhunia, Swarup A1 Trivedi, Amit Ranjan YR 2020 SP 219 OP 224 LK http://dx.doi.org/https://doi.org/10.1109/ISQED48828.2020.9136981 DO https://doi.org/10.1109/ISQED48828.2020.9136981 SF ELIB - SuUB Bremen
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