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Combining exposure indicators and predictive analytics for ..:

, In: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT,
Brignoli, M. A. ; Mazzaro, S. ; Fortunato, G.... - p. 423-428 , 2020
Link: https://doi.org/10.1109/MetroInd4.0IoT48571.2020.91381..