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1 Ergebnisse
1
In-Line Quality Control in Semiconductors Production and Av..:
, In:
2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT
,
Petritoli, Enrico
;
Leccese, Fabio
;
Spagnolo, Giuseppe Schirripa
- p. 665-668 , 2020
Link:
https://doi.org/10.1109/MetroInd4.0IoT48571.2020.91382..
RT T1
2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT
: T1
In-Line Quality Control in Semiconductors Production and Availability for Industry 4.0
UL https://suche.suub.uni-bremen.de/peid=ieee-9138296&Exemplar=1&LAN=DE A1 Petritoli, Enrico A1 Leccese, Fabio A1 Spagnolo, Giuseppe Schirripa YR 2020 K1 In-Line K1 Quality K1 Control K1 Semiconductors K1 Production K1 Availability K1 Industry 4.0 SP 665 OP 668 LK http://dx.doi.org/https://doi.org/10.1109/MetroInd4.0IoT48571.2020.9138296 DO https://doi.org/10.1109/MetroInd4.0IoT48571.2020.9138296 SF ELIB - SuUB Bremen
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