I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
A Smart Sensing Method for Real- Time Monitoring of Low Vol..:
, In:
2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON)
,
Ala, Guido
;
Artale, Giovanni
;
Cataliotti, Antonio
... - p. 512-516 , 2020
Link:
https://doi.org/10.1109/MELECON48756.2020.9140599
RT T1 <cTitle>2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON)</cTitle>: T1 <Title>A Smart Sensing Method for Real- Time Monitoring of Low Voltage Series-Arc-Fault</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9140599&Exemplar=1&LAN=DE A1 Ala, Guido A1 Artale, Giovanni A1 Cataliotti, Antonio A1 Cosentino, Valentina A1 Fontana, Claudio A1 Romano, Pietro A1 Viola, Fabio YR 2020 SN 2158-8481 K1 Fault detection K1 Circuit faults K1 Real-time systems K1 Noise reduction K1 Standards K1 Microsoft Windows K1 Low voltage K1 Series arc fault K1 arc fault current interrupter (AFCI) K1 arc fault detection devices (AFDD) SP 512 OP 516 LK http://dx.doi.org/https://doi.org/10.1109/MELECON48756.2020.9140599 DO https://doi.org/10.1109/MELECON48756.2020.9140599 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
