I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Effects of Solder Voiding on the Reliability and Thermal Ch..:
, In:
2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)
,
Wilcoxon, Ross
;
Hillman, Dave
;
Pearson, Tim
- p. 124-130 , 2020
Link:
https://doi.org/10.23919/SEMI-THERM50369.2020.9142833
RT T1 <cTitle>2020 36th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)</cTitle>: T1 <Title>Effects of Solder Voiding on the Reliability and Thermal Characteristics of Quad Flatpack No-lead (QFN) Components</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9142833&Exemplar=1&LAN=DE A1 Wilcoxon, Ross A1 Hillman, Dave A1 Pearson, Tim YR 2020 K1 Thermal resistance K1 Reliability K1 Printed circuits K1 Thermal conductivity K1 Copper K1 Quad flatpack no-lead (QFN) K1 Solder voiding K1 thermal resistance SP 124 OP 130 LK http://dx.doi.org/https://doi.org/10.23919/SEMI-THERM50369.2020.9142833 DO https://doi.org/10.23919/SEMI-THERM50369.2020.9142833 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
