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Test Scheduling for Low Transition Reusable LFSR based BIST..:

, In: 2020 4th International Conference on Trends in Electronics and Informatics (ICOEI)(48184),
Divya, Bandi ; Mohan, Navya - p. 1-6 , 2020
Link: https://doi.org/10.1109/ICOEI48184.2020.9143017