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Ensemble learning-based approach for crack detection using ..:
, In:
2020 4th International Conference on Trends in Electronics and Informatics (ICOEI)(48184)
,
Kailkhura, Vibhu
;
Aravindh, S.
;
Jha, Shashank Shekhar
. - p. 808-815 , 2020
Link:
https://doi.org/10.1109/ICOEI48184.2020.9143035
RT T1 <cTitle>2020 4th International Conference on Trends in Electronics and Informatics (ICOEI)(48184)</cTitle>: T1 <Title>Ensemble learning-based approach for crack detection using CNN</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9143035&Exemplar=1&LAN=DE A1 Kailkhura, Vibhu A1 Aravindh, S. A1 Jha, Shashank Shekhar A1 Jayanthi, N. YR 2020 K1 Feature extraction K1 Convolutional neural networks K1 Predictive models K1 Analytical models K1 Surface cracks K1 Image segmentation K1 crack detection K1 convolutional neural network (CNN) K1 transfer learning K1 ensemble learning SP 808 OP 815 LK http://dx.doi.org/https://doi.org/10.1109/ICOEI48184.2020.9143035 DO https://doi.org/10.1109/ICOEI48184.2020.9143035 SF ELIB - SuUB Bremen
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