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1 Ergebnisse
1
Anti-SEU design of SRAM based on FinFET process:
, In:
2020 International Wireless Communications and Mobile Computing (IWCMC)
,
Zhang, Man
;
Zhang, Lijun
;
Zhang, Yiping
- p. 878-881 , 2020
Link:
https://doi.org/10.1109/IWCMC48107.2020.9148056
RT T1
2020 International Wireless Communications and Mobile Computing (IWCMC)
: T1
Anti-SEU design of SRAM based on FinFET process
UL https://suche.suub.uni-bremen.de/peid=ieee-9148056&Exemplar=1&LAN=DE A1 Zhang, Man A1 Zhang, Lijun A1 Zhang, Yiping YR 2020 SN 2376-6506 K1 Computer architecture K1 Microprocessors K1 FinFETs K1 SRAM cells K1 Periodic structures K1 Leakage currents K1 SEU K1 FinFET K1 WM K1 DICEPM K1 RSNM SP 878 OP 881 LK http://dx.doi.org/https://doi.org/10.1109/IWCMC48107.2020.9148056 DO https://doi.org/10.1109/IWCMC48107.2020.9148056 SF ELIB - SuUB Bremen
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