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Stress-induced Vertical Deformations in state-of-the-art Po..:

, In: 2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
Catalano, A. P. ; Olanrewaju, O. ; Scognamillo, C... - p. 1-4 , 2020
Link: https://doi.org/10.1109/EuroSimE48426.2020.9152727