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1 Ergebnisse
1
Flexible FPGA Based Digital IC Test Development Education L..:
, In:
2020 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON)
,
Grout, Ian
- p. 341-344 , 2020
Link:
https://doi.org/10.1109/ECTI-CON49241.2020.9158091
RT T1 <cTitle>2020 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON)</cTitle>: T1 <Title>Flexible FPGA Based Digital IC Test Development Education Laboratory Design and Application</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9158091&Exemplar=1&LAN=DE A1 Grout, Ian YR 2020 K1 Field programmable gate arrays K1 Hardware K1 Software K1 Testing K1 Circuit faults K1 Education K1 test engineering K1 machine learning K1 JTAG K1 VHDL K1 FPGA SP 341 OP 344 LK http://dx.doi.org/https://doi.org/10.1109/ECTI-CON49241.2020.9158091 DO https://doi.org/10.1109/ECTI-CON49241.2020.9158091 SF ELIB - SuUB Bremen
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