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1 Ergebnisse
1
Defect detection based on singular value decomposition and ..:
, In:
2020 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM)
,
Tran, Xuan Tuyen
;
Dinh, Tran Hiep
;
Le, Ha Vu
.. - p. 1149-1154 , 2020
Link:
https://doi.org/10.1109/AIM43001.2020.9159005
RT T1 <cTitle>2020 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM)</cTitle>: T1 <Title>Defect detection based on singular value decomposition and histogram thresholding</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9159005&Exemplar=1&LAN=DE A1 Tran, Xuan Tuyen A1 Dinh, Tran Hiep A1 Le, Ha Vu A1 Zhu, Qiuchen A1 Ha, Quang YR 2020 SN 2159-6255 K1 Histograms K1 Matrix decomposition K1 Thresholding (Imaging) K1 Eigenvalues and eigenfunctions K1 Surface cracks K1 Singular value decomposition K1 Inspection SP 1149 OP 1154 LK http://dx.doi.org/https://doi.org/10.1109/AIM43001.2020.9159005 DO https://doi.org/10.1109/AIM43001.2020.9159005 SF ELIB - SuUB Bremen
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