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An Overview of the Risk Posed by Thermal Neutrons to the Re..:
, In:
2020 50th Annual IEEE-IFIP International Conference on Dependable Systems and Networks-Supplemental Volume (DSN-S)
,
Oliveira, Daniel
;
Blanchard, Sean
;
DeBardeleben, Nathan
... - p. 92-97 , 2020
Link:
https://doi.org/10.1109/DSN-S50200.2020.00047
RT T1 <cTitle>2020 50th Annual IEEE-IFIP International Conference on Dependable Systems and Networks-Supplemental Volume (DSN-S)</cTitle>: T1 <Title>An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9159152&Exemplar=1&LAN=DE A1 Oliveira, Daniel A1 Blanchard, Sean A1 DeBardeleben, Nathan A1 Santos, Fermando A1 Davila, Gabriel A1 Navaux, Philippe A1 Wender, Stephen A1 Cazzaniga, Carlo A1 Frost, Christopher A1 Baumann, Robert A1 Rech, Paolo YR 2020 K1 Neutrons K1 Reliability K1 Error analysis K1 Boron K1 Sensitivity K1 Performance evaluation K1 Manufacturing processes K1 n/a SP 92 OP 97 LK http://dx.doi.org/https://doi.org/10.1109/DSN-S50200.2020.00047 DO https://doi.org/10.1109/DSN-S50200.2020.00047 SF ELIB - SuUB Bremen
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