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1 Ergebnisse
1
Challenges of large Fan out multi-chip module and fine Cu l..:
, In:
2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
,
Lung Huang, Yu
;
Key Chung, C.
;
Lin, C. F.
... - p. 1140-1145 , 2020
Link:
https://doi.org/10.1109/ECTC32862.2020.00183
RT T1
2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
: T1
Challenges of large Fan out multi-chip module and fine Cu line space
UL https://suche.suub.uni-bremen.de/peid=ieee-9159180&Exemplar=1&LAN=DE A1 Lung Huang, Yu A1 Key Chung, C. A1 Lin, C. F. A1 Hua LU, Guan A1 Hung Tseng, Ching A1 Da Chang, Hong A1 Hsun Hsu, Chih A1 Xu, Bruce YR 2020 SN 2377-5726 K1 TV K1 Reliability K1 Temperature measurement K1 ISO K1 ISO Standards K1 Monitoring K1 Temperature sensors K1 Fan-out K1 Multi-chip K1 RDL K1 Cu line K1 Fine Cu line space K1 Fine pitch K1 Large PKG K1 FOMCM SP 1140 OP 1145 LK http://dx.doi.org/https://doi.org/10.1109/ECTC32862.2020.00183 DO https://doi.org/10.1109/ECTC32862.2020.00183 SF ELIB - SuUB Bremen
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