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Imaging sub-surface defects in power electronic modules usi..:

, In: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC),
Venkatesh, Vijay ; Joshi, Shailesh N. ; Baba Sundaresan, Vishnu - p. 1396-1401 , 2020
Link: https://doi.org/10.1109/ECTC32862.2020.00221