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1 Ergebnisse
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Imaging sub-surface defects in power electronic modules usi..:
, In:
2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
,
Venkatesh, Vijay
;
Joshi, Shailesh N.
;
Baba Sundaresan, Vishnu
- p. 1396-1401 , 2020
Link:
https://doi.org/10.1109/ECTC32862.2020.00221
RT T1
2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
: T1
Imaging sub-surface defects in power electronic modules using shear-force microscopy
UL https://suche.suub.uni-bremen.de/peid=ieee-9159432&Exemplar=1&LAN=DE A1 Venkatesh, Vijay A1 Joshi, Shailesh N. A1 Baba Sundaresan, Vishnu YR 2020 SN 2377-5726 K1 Probes K1 Microscopy K1 Substrates K1 Silicon K1 Acoustics K1 Receivers K1 Power electronics K1 shear-force K1 power electronic device K1 sub-surface imaging SP 1396 OP 1401 LK http://dx.doi.org/https://doi.org/10.1109/ECTC32862.2020.00221 DO https://doi.org/10.1109/ECTC32862.2020.00221 SF ELIB - SuUB Bremen
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