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1 Ergebnisse
1
Influence of Copper Wire Material Additive Elements to the ..:
, In:
2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
,
Klengel, Robert
;
Klengel, Sandy
;
Schischka, Jan
... - p. 774-781 , 2020
Link:
https://doi.org/10.1109/ECTC32862.2020.00127
RT T1
2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
: T1
Influence of Copper Wire Material Additive Elements to the Reliability of Wire Bonded Contacts
UL https://suche.suub.uni-bremen.de/peid=ieee-9159444&Exemplar=1&LAN=DE A1 Klengel, Robert A1 Klengel, Sandy A1 Schischka, Jan A1 Stephan, Tino A1 Petzold, Matthias A1 Eto, Motoki A1 Araki, Noritoshi A1 Yamada, Takashi YR 2020 SN 2377-5726 K1 Wires K1 Copper K1 Corrosion K1 High-temperature superconductors K1 Intermetallic K1 Materials reliability K1 APC wire K1 wire bonding K1 corrosion resistance K1 reliable packaging K1 automotive electronics packaging K1 high temperature electronics K1 materials for harsh environments SP 774 OP 781 LK http://dx.doi.org/https://doi.org/10.1109/ECTC32862.2020.00127 DO https://doi.org/10.1109/ECTC32862.2020.00127 SF ELIB - SuUB Bremen
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