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1 Ergebnisse
1
Sintered Micro-Silver Paste Doped with Indium for Die Attac..:
, In:
2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
,
Tsai, Chin-Hao
;
Huang, Wei-Chen
;
Kao, C. Robert
... - p. 1430-1435 , 2020
Link:
https://doi.org/10.1109/ECTC32862.2020.00226
RT T1
2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
: T1
Sintered Micro-Silver Paste Doped with Indium for Die Attachment Applications of Power ICs
UL https://suche.suub.uni-bremen.de/peid=ieee-9159480&Exemplar=1&LAN=DE A1 Tsai, Chin-Hao A1 Huang, Wei-Chen A1 Kao, C. Robert A1 Chew, Ly May A1 Schmitt, Wolfgang A1 Nishikawa, Hiroshi YR 2020 SN 2377-5726 K1 Silver K1 Indium K1 Bonding K1 Temperature K1 Substrates K1 Intermetallic K1 Copper K1 Micro-silver sintering K1 Transient liquid phase bonding K1 Silver-indium intermetallic compound K1 High temperature packaging materials K1 Reliability Analysis SP 1430 OP 1435 LK http://dx.doi.org/https://doi.org/10.1109/ECTC32862.2020.00226 DO https://doi.org/10.1109/ECTC32862.2020.00226 SF ELIB - SuUB Bremen
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