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1 Ergebnisse
1
Microfabricated SERF Atomic Magnetometers for Measurement o..:
, In:
2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
,
Liu, Kangni
;
Shang, Jintang
;
Zhang, Jin
... - p. 991-996 , 2020
Link:
https://doi.org/10.1109/ECTC32862.2020.00161
RT T1 <cTitle>2020 IEEE 70th Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>Microfabricated SERF Atomic Magnetometers for Measurement of Weak Magnetic Field</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9159497&Exemplar=1&LAN=DE A1 Liu, Kangni A1 Shang, Jintang A1 Zhang, Jin A1 Yue, Xiang A1 Ye, Chen A1 Zhang, Jianfeng A1 Wong, Ching-Ping YR 2020 SN 2377-5726 K1 Magnetic fields K1 Atomic measurements K1 Magnetometers K1 Magnetic field measurement K1 Sensitivity K1 Atom optics K1 Metals K1 SERF atomic magnetometer K1 weak magnetic field K1 microfabrication SP 991 OP 996 LK http://dx.doi.org/https://doi.org/10.1109/ECTC32862.2020.00161 DO https://doi.org/10.1109/ECTC32862.2020.00161 SF ELIB - SuUB Bremen
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