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Representing Gate-Level SET Faults by Multiple SEU Faults a..:

, In: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Bagbaba, Ahmet Cagri ; Jenihhin, Maksim ; Ubar, Raimund. - p. 1-6 , 2020
Link: https://doi.org/10.1109/IOLTS50870.2020.9159715