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1 Ergebnisse
1
A Low Capture Power Oriented X-Identification-Filling Co-Op..:
, In:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)
,
Hosokawa, Toshinori
;
Misawa, Kenichiro
;
Yamazaki, Hiroshi
.. - p. 1-4 , 2020
Link:
https://doi.org/10.1109/IOLTS50870.2020.9159735
RT T1
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)
: T1
A Low Capture Power Oriented X-Identification-Filling Co-Optimization Method
UL https://suche.suub.uni-bremen.de/peid=ieee-9159735&Exemplar=1&LAN=DE A1 Hosokawa, Toshinori A1 Misawa, Kenichiro A1 Yamazaki, Hiroshi A1 Yoshimura, Masayoshi A1 Arai, Masayuki YR 2020 SN 1942-9401 K1 Circuit faults K1 Testing K1 Delays K1 Power dissipation K1 Switches K1 Fault diagnosis K1 X-identification-filling K1 low capture power testing K1 Partial MaxSAT K1 capture-unsafe test vectors K1 unsafe faults K1 co-optimization SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IOLTS50870.2020.9159735 DO https://doi.org/10.1109/IOLTS50870.2020.9159735 SF ELIB - SuUB Bremen
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