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Leveraging CMOS Aging for Efficient Microelectronics Design:

, In: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Martinez, Antonio Leonel Hernandez ; Khursheed, Saqib ; Rossi, Daniele - p. 1-4 , 2020
Link: https://doi.org/10.1109/IOLTS50870.2020.9159742