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1 Ergebnisse
1
Error Modeling for Image Processing Filters accelerated ont..:
, In:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)
,
Bolchini, Cristiana
;
Cassano, Luca
;
Mazzeo, Andrea
. - p. 1-6 , 2020
Link:
https://doi.org/10.1109/IOLTS50870.2020.9159746
RT T1
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)
: T1
Error Modeling for Image Processing Filters accelerated onto SRAM-based FPGAs
UL https://suche.suub.uni-bremen.de/peid=ieee-9159746&Exemplar=1&LAN=DE A1 Bolchini, Cristiana A1 Cassano, Luca A1 Mazzeo, Andrea A1 Miele, Antonio YR 2020 SN 1942-9401 K1 Circuit faults K1 Image processing K1 Field programmable gate arrays K1 Analytical models K1 Integrated circuit modeling K1 Integrated circuit reliability K1 Error Modeling K1 Error Simulation K1 Fault Injection K1 Fault Tolerance K1 Image Processing K1 Reliability Analysis SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IOLTS50870.2020.9159746 DO https://doi.org/10.1109/IOLTS50870.2020.9159746 SF ELIB - SuUB Bremen
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