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Life-Time Prognostics of Dependable VLSI-SoCs using Machine..:
, In:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)
,
Bagheriye, Leila
;
Ali, Ghazanfar
;
Kerkhoff, Hans G.
- p. 1-4 , 2020
Link:
https://doi.org/10.1109/IOLTS50870.2020.9159753
RT T1
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)
: T1
Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning
UL https://suche.suub.uni-bremen.de/peid=ieee-9159753&Exemplar=1&LAN=DE A1 Bagheriye, Leila A1 Ali, Ghazanfar A1 Kerkhoff, Hans G. YR 2020 SN 1942-9401 K1 Aging K1 Mathematical model K1 Instruments K1 Machine learning K1 Temperature measurement K1 System-on-chip K1 Data integration K1 Dependability K1 Reliability K1 MPSoC K1 Embedded Instruments (EIs) K1 Data Fusion K1 Data-driven K1 Lifetime prediction K1 EOL K1 Machine Learning SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IOLTS50870.2020.9159753 DO https://doi.org/10.1109/IOLTS50870.2020.9159753 SF ELIB - SuUB Bremen
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