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1 Ergebnisse
1
Automated Model Generation Including Variations for Formal ..:
, In:
2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)
,
Rechmal-Lesse, Malgorzata
;
Koroa, Gerald Alexander
;
Adhisantoso, Yeremia Gunawan
. - p. 66-69 , 2020
Link:
https://doi.org/10.1109/NEWCAS49341.2020.9159822
RT T1
2020 18th IEEE International New Circuits and Systems Conference (NEWCAS)
: T1
Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits
UL https://suche.suub.uni-bremen.de/peid=ieee-9159822&Exemplar=1&LAN=DE A1 Rechmal-Lesse, Malgorzata A1 Koroa, Gerald Alexander A1 Adhisantoso, Yeremia Gunawan A1 Olbrich, Markus YR 2020 K1 Mathematical model K1 Integrated circuit modeling K1 Computational modeling K1 Reachability analysis K1 Analytical models K1 Uncertainty K1 Numerical models K1 formal verification K1 reachability analysis K1 nonlinear analog circuit K1 piecewise linear model K1 uncertainties SP 66 OP 69 LK http://dx.doi.org/https://doi.org/10.1109/NEWCAS49341.2020.9159822 DO https://doi.org/10.1109/NEWCAS49341.2020.9159822 SF ELIB - SuUB Bremen
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