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1 Ergebnisse
1
A Method of Level Set Segmentation for Detecting Surface Di..:
, In:
2020 Chinese Control And Decision Conference (CCDC)
,
Huang, Dan
;
Hu, Yueming
;
Ma, Ge
- p. 5027-5032 , 2020
Link:
https://doi.org/10.1109/CCDC49329.2020.9164221
RT T1
2020 Chinese Control And Decision Conference (CCDC)
: T1
A Method of Level Set Segmentation for Detecting Surface Distribution of Wafer Dopant
UL https://suche.suub.uni-bremen.de/peid=ieee-9164221&Exemplar=1&LAN=DE A1 Huang, Dan A1 Hu, Yueming A1 Ma, Ge YR 2020 SN 1948-9447 K1 Image segmentation K1 Level set K1 Surface morphology K1 Semiconductor device modeling K1 Image edge detection K1 Semiconductor process modeling K1 Entropy K1 level set K1 curvature K1 gradient K1 K-means K1 image entropy K1 wafer dopant SP 5027 OP 5032 LK http://dx.doi.org/https://doi.org/10.1109/CCDC49329.2020.9164221 DO https://doi.org/10.1109/CCDC49329.2020.9164221 SF ELIB - SuUB Bremen
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