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1 Ergebnisse
1
Temperature Impact on The ION/IOFF Ratio of Gate All Around..:
, In:
2020 IEEE International Conference on Semiconductor Electronics (ICSE)
,
Agha, Firas Natheer Abdul-kadir
;
Hashim, Yasir
;
Shakib, Mohammed Nazmus
- p. 61-64 , 2020
Link:
https://doi.org/10.1109/ICSE49846.2020.9166887
RT T1
2020 IEEE International Conference on Semiconductor Electronics (ICSE)
: T1
Temperature Impact on The ION/IOFF Ratio of Gate All Around Nanowire TFET
UL https://suche.suub.uni-bremen.de/peid=ieee-9166887&Exemplar=1&LAN=DE A1 Agha, Firas Natheer Abdul-kadir A1 Hashim, Yasir A1 Shakib, Mohammed Nazmus YR 2020 K1 Temperature K1 TFETs K1 Logic gates K1 Ions K1 MOSFET K1 Silicon K1 Nanowire K1 Transistor K1 TFET K1 IOFF K1 ION SP 61 OP 64 LK http://dx.doi.org/https://doi.org/10.1109/ICSE49846.2020.9166887 DO https://doi.org/10.1109/ICSE49846.2020.9166887 SF ELIB - SuUB Bremen
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