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Radiation Influence Comparison between SiC JMOS and DMOS:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Hsu, Fu-Jen ; Hung, Chien-Chung ; Chu, Kuo-Ting... - p. 146-149 , 2020
Link: https://doi.org/10.1109/ISPSD46842.2020.9170058