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SiC MOSFETs soft and hard failure modes: functional analysi..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Richardeau, F. ; Boige, F. ; Castellazzi, A.... - p. 170-173 , 2020
Link: https://doi.org/10.1109/ISPSD46842.2020.9170094