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1 Ergebnisse
1
Suppression of Hot-Hole Injection in High-Voltage Triple RE..:
, In:
2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Qiao, Ming
;
Yuan, Zhangyi'an
;
Li, Yi
... - p. 415-418 , 2020
Link:
https://doi.org/10.1109/ISPSD46842.2020.9170104
RT T1 <cTitle>2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD)</cTitle>: T1 <Title>Suppression of Hot-Hole Injection in High-Voltage Triple RESURF LDMOS With Sandwich N-P-N Layer: Toward High-Performance and High-Reliability</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9170104&Exemplar=1&LAN=DE A1 Qiao, Ming A1 Yuan, Zhangyi'an A1 Li, Yi A1 Zhou, Xin A1 Jin, Feng A1 Yang, Jiye A1 Cai, Ying A1 Li, Zhaoji A1 Zhang, Bo YR 2020 SN 1946-0201 K1 Burnout K1 hot-hole injection K1 LDMOS K1 triple RESURF K1 sandwich N-P-N layer SP 415 OP 418 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD46842.2020.9170104 DO https://doi.org/10.1109/ISPSD46842.2020.9170104 SF ELIB - SuUB Bremen
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