I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Evolution of reverse recovery in trench MOSFETs:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Ferrara, A. ; Siemieniec, R. ; Medic, U.... - p. 549-552 , 2020
Link: https://doi.org/10.1109/ISPSD46842.2020.9170155