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Elaboration and Characterization of ZnO/FTO thin films unde..:

, In: 2020 International Conference on Electrical, Communication, and Computer Engineering (ICECCE),

Hamza, Slimani ; Sawsan, Dagher ; Noureddine, Bessous... - p. 1-6 , 2020

Link: https://doi.org/10.1109/ICECCE49384.2020.9179359

RT 
T1 <cTitle>2020 International Conference on Electrical, Communication, and Computer Engineering (ICECCE)</cTitle>: T1 <Title>Elaboration and Characterization of ZnO/FTO thin films under different concentrations - Study dedicated to the photovoltaic systems -</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9179359&Exemplar=1&LAN=DE
				
A1 Hamza, Slimani
A1 Sawsan, Dagher
A1 Noureddine, Bessous
A1 Atmane, Benhaoua
A1 Eddine, Laouini Salah
A1 Mourad, Mimouni
A1 Mebrouk, Ghougali
A1 Nacer, Chaabia
A1 Al Khatib, Fawwaz
A1 Akhozheya, Boshra
A1 El Gamal, Maisa
A1 Tliba, Ali
YR 2020
K1 Zinc oxide
K1 II-VI semiconductor materials
K1 Substrates
K1 Photovoltaic systems
K1 Photovoltaic cells
K1 Optical films
K1 Photonics
K1 photovoltaic system
K1 electrical current
K1 semiconductor
K1 fluorine tin oxide
K1 zinc oxide
K1 thin films
K1 spray pyrolysis
K1 XRD diffraction
K1 FT-IR technique
SP 1
OP 6
LK http://dx.doi.org/https://doi.org/10.1109/ICECCE49384.2020.9179359
DO https://doi.org/10.1109/ICECCE49384.2020.9179359
SF ELIB - SuUB Bremen

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