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1 Ergebnisse
1
Investigation on Quadruple Gate FinFET Structure in Absence..:
, In:
2020 IEEE VLSI DEVICE CIRCUIT AND SYSTEM (VLSI DCS)
,
Le Minh Toan, Ho
;
Suvadarsini Singh, Sruti
- p. 66-69 , 2020
Link:
https://doi.org/10.1109/VLSIDCS47293.2020.9179892
RT T1
2020 IEEE VLSI DEVICE CIRCUIT AND SYSTEM (VLSI DCS)
: T1
Investigation on Quadruple Gate FinFET Structure in Absence of All the Corner Metal Gate Regions
UL https://suche.suub.uni-bremen.de/peid=ieee-9179892&Exemplar=1&LAN=DE A1 Le Minh Toan, Ho A1 Suvadarsini Singh, Sruti YR 2020 K1 Logic gates K1 FinFETs K1 Transconductance K1 Ions K1 Metals K1 Performance evaluation K1 MOSFET K1 Quadruple gate FinFET K1 Ion K1 Ioff K1 DIBL K1 SCEs SP 66 OP 69 LK http://dx.doi.org/https://doi.org/10.1109/VLSIDCS47293.2020.9179892 DO https://doi.org/10.1109/VLSIDCS47293.2020.9179892 SF ELIB - SuUB Bremen
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