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Influence of elongation and washing on double-layer R2R-pri..:
, In:
2020 IEEE 20th International Conference on Nanotechnology (IEEE-NANO)
,
Sliz, Rafal
;
Huttunen, Olli-Heikki
;
Jansson, Elina
... - p. 282-287 , 2020
Link:
https://doi.org/10.1109/NANO47656.2020.9183549
RT T1
2020 IEEE 20th International Conference on Nanotechnology (IEEE-NANO)
: T1
Influence of elongation and washing on double-layer R2R-printed flexible electrodes for smart clothing applications
UL https://suche.suub.uni-bremen.de/peid=ieee-9183549&Exemplar=1&LAN=DE A1 Sliz, Rafal A1 Huttunen, Olli-Heikki A1 Jansson, Elina A1 Kemppainen, Juhani A1 Schroderus, Jyrki A1 Kurkinen, Marika A1 Fabritius, Tapio YR 2020 SN 1944-9380 K1 Electrodes K1 Electronic countermeasures K1 Resistance K1 Shape K1 Surface morphology K1 Reliability K1 Surface cracks SP 282 OP 287 LK http://dx.doi.org/https://doi.org/10.1109/NANO47656.2020.9183549 DO https://doi.org/10.1109/NANO47656.2020.9183549 SF ELIB - SuUB Bremen
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