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1 Ergebnisse
1
Enabling Large-scale Fine-grained Simulation of IED Vapor C..:
, In:
2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)
,
Agambayev, Agamyrat
;
Sang, Christopher Lue
;
Blain Christen, Jennifer
. - p. 73-76 , 2020
Link:
https://doi.org/10.1109/MWSCAS48704.2020.9184431
RT T1
2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)
: T1
Enabling Large-scale Fine-grained Simulation of IED Vapor Concentration in Open-air Environments
UL https://suche.suub.uni-bremen.de/peid=ieee-9184431&Exemplar=1&LAN=DE A1 Agambayev, Agamyrat A1 Sang, Christopher Lue A1 Blain Christen, Jennifer A1 Ozev, Sule YR 2020 SN 1558-3899 K1 Computational modeling K1 Adaptation models K1 Explosives K1 Sensors K1 Containers K1 Two dimensional displays K1 Simulation K1 IED K1 Ammonium K1 Nitromethane K1 Concentration SP 73 OP 76 LK http://dx.doi.org/https://doi.org/10.1109/MWSCAS48704.2020.9184431 DO https://doi.org/10.1109/MWSCAS48704.2020.9184431 SF ELIB - SuUB Bremen
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