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1 Ergebnisse
1
Experimental Validation of CT-Snubber for Multichip SiC MOS..:
, In:
2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)
,
Fu, Bo
;
Shahabi, Ali
;
Freeborn, Todd J.
.. - p. 419-423 , 2020
Link:
https://doi.org/10.1109/MWSCAS48704.2020.9184502
RT T1 <cTitle>2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS)</cTitle>: T1 <Title>Experimental Validation of CT-Snubber for Multichip SiC MOSFET Power Module</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9184502&Exemplar=1&LAN=DE A1 Fu, Bo A1 Shahabi, Ali A1 Freeborn, Todd J. A1 Lemmon, Andrew N. A1 Kisacikoglu, Mithat C. YR 2020 SN 1558-3899 K1 Impedance K1 Resonant frequency K1 Bandwidth K1 Snubbers K1 Resistance K1 Silicon carbide K1 Switches K1 Double-Pulse Testing K1 Multi-Chip SiC Power Module K1 Voltage Overshoot K1 Settling Time K1 Snubbing SP 419 OP 423 LK http://dx.doi.org/https://doi.org/10.1109/MWSCAS48704.2020.9184502 DO https://doi.org/10.1109/MWSCAS48704.2020.9184502 SF ELIB - SuUB Bremen
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