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Killing EM Side-Channel Leakage at its Source:

, In: 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS),
Das, Debayan ; Nath, Mayukh ; Ghosh, Santosh. - p. 1108-1111 , 2020
Link: https://doi.org/10.1109/MWSCAS48704.2020.9184657