I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Method for improving stability of plasma ignition in a mult..:
, In:
2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
,
Gruss-Gifford, Jessica
;
Mehta, Virat
;
Straten, Oscar van der
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/ASMC49169.2020.9185236
RT T1
2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
: T1
Method for improving stability of plasma ignition in a multi-cathode magnetron PVD system
UL https://suche.suub.uni-bremen.de/peid=ieee-9185236&Exemplar=1&LAN=DE A1 Gruss-Gifford, Jessica A1 Mehta, Virat A1 Straten, Oscar van der A1 Rodriguez, Gabriel A1 Lippitt, Maxwell A1 Canaperi, Donald YR 2020 SN 2376-6697 K1 Ignition K1 Plasmas K1 Cathodes K1 Atomic measurements K1 Atomic layer deposition K1 Sputtering K1 Tools K1 Physical Vapor Deposition (PVD) K1 plasma ignition K1 semiconductors K1 high pressure ignition K1 ignition faults K1 thin films SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ASMC49169.2020.9185236 DO https://doi.org/10.1109/ASMC49169.2020.9185236 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)