I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Characteristics of SiGe Oxidation and Ge Loss according to ..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Kwon, Meejung ; Han, SongI ; Ryu, Je Hyeok... - p. 1-4 , 2020
Link: https://doi.org/10.1109/ASMC49169.2020.9185260