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1 Ergebnisse
1
Learning Style Correlation for Elaborate Few-Shot Classific..:
, In:
2020 IEEE International Conference on Image Processing (ICIP)
,
Kim, Junho
;
Kim, Minsu
;
Kim, Jung Uk
... - p. 1791-1795 , 2020
Link:
https://doi.org/10.1109/ICIP40778.2020.9190685
RT T1 <cTitle>2020 IEEE International Conference on Image Processing (ICIP)</cTitle>: T1 <Title>Learning Style Correlation for Elaborate Few-Shot Classification</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9190685&Exemplar=1&LAN=DE A1 Kim, Junho A1 Kim, Minsu A1 Kim, Jung Uk A1 Lee, Hong Joo A1 Lee, Sangmin A1 Hong, Joanna A1 Ro, Yong Man YR 2020 SN 2381-8549 K1 Feature extraction K1 Measurement K1 Correlation K1 Data mining K1 Task analysis K1 Machine learning K1 Visualization K1 Deep learning K1 Style correlation K1 Style Correlated Module K1 Few-shot classification SP 1791 OP 1795 LK http://dx.doi.org/https://doi.org/10.1109/ICIP40778.2020.9190685 DO https://doi.org/10.1109/ICIP40778.2020.9190685 SF ELIB - SuUB Bremen
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