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1 Ergebnisse
1
Proficiency Testing Scheme of Conducted disturbance at main..:
, In:
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
,
Jincai, Mi
;
Hui, Chen
;
Qunxing, Liu
... - p. 663-665 , 2020
Link:
https://doi.org/10.1109/EMCSI38923.2020.9191459
RT T1 <cTitle>2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)</cTitle>: T1 <Title>Proficiency Testing Scheme of Conducted disturbance at mains terminals in 150kHz∼30MHz using Multi-items</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9191459&Exemplar=1&LAN=DE A1 Jincai, Mi A1 Hui, Chen A1 Qunxing, Liu A1 Xin, Liu A1 Rui, Chu A1 jun, Song YR 2020 K1 Testing K1 Standards K1 Frequency measurement K1 Voltage measurement K1 Stability criteria K1 Plugs K1 Proficiency Testing Scheme K1 Conducted disturbance K1 Mains terminals K1 Multi-items K1 Comb signal SP 663 OP 665 LK http://dx.doi.org/https://doi.org/10.1109/EMCSI38923.2020.9191459 DO https://doi.org/10.1109/EMCSI38923.2020.9191459 SF ELIB - SuUB Bremen
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