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1 Ergebnisse
1
Commercial USB IC Soft-Failure Sensitivity Measurement Meth..:
, In:
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
,
Hua, Runbing
;
Hoseini, Omid
;
Peng, Zhekun
... - p. 200-204 , 2020
Link:
https://doi.org/10.1109/EMCSI38923.2020.9191592
RT T1 <cTitle>2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)</cTitle>: T1 <Title>Commercial USB IC Soft-Failure Sensitivity Measurement Method and Trend Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9191592&Exemplar=1&LAN=DE A1 Hua, Runbing A1 Hoseini, Omid A1 Peng, Zhekun A1 Shumiya, Hideki A1 Konno, Shota A1 Araki, Kenji A1 Pommerenke, David A1 Kim, Donghyun YR 2020 K1 Partial discharges K1 Electrostatic discharges K1 Universal Serial Bus K1 Sensitivity K1 Market research K1 electrostatic discharge K1 soft-failure K1 USB IC susceptibility SP 200 OP 204 LK http://dx.doi.org/https://doi.org/10.1109/EMCSI38923.2020.9191592 DO https://doi.org/10.1109/EMCSI38923.2020.9191592 SF ELIB - SuUB Bremen
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