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1 Ergebnisse
1
Dominant Timing Direct Identification for Radiation Noise d..:
, In:
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
,
Tadakuma, Toshiya
;
Nishi, Koichi
;
Rogers, Michael
. - p. 73-78 , 2020
Link:
https://doi.org/10.1109/EMCSI38923.2020.9191602
RT T1 <cTitle>2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)</cTitle>: T1 <Title>Dominant Timing Direct Identification for Radiation Noise due to Extended Double Pulse Test on Bare SiC MOSFET and Si RC-IGBT Chips</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9191602&Exemplar=1&LAN=DE A1 Tadakuma, Toshiya A1 Nishi, Koichi A1 Rogers, Michael A1 Shoyama, Masahito YR 2020 K1 MOSFET K1 Silicon carbide K1 Switches K1 Silicon K1 Logic gates K1 Antenna measurements K1 Probes K1 SiC K1 Si K1 RC-IGBT K1 radiation noise K1 EMC K1 EMI K1 Wavelet transform SP 73 OP 78 LK http://dx.doi.org/https://doi.org/10.1109/EMCSI38923.2020.9191602 DO https://doi.org/10.1109/EMCSI38923.2020.9191602 SF ELIB - SuUB Bremen
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