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1 Ergebnisse
1
Current-to-Voltage Conversion with Integrated Quantum Hall ..:
, In:
2020 Conference on Precision Electromagnetic Measurements (CPEM)
,
Chae, Dong-Hun
;
Kim, Mun-Seog
;
Kim, Wan-Seop
.. - p. 1-2 , 2020
Link:
https://doi.org/10.1109/CPEM49742.2020.9191697
RT T1 <cTitle>2020 Conference on Precision Electromagnetic Measurements (CPEM)</cTitle>: T1 <Title>Current-to-Voltage Conversion with Integrated Quantum Hall Resistors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9191697&Exemplar=1&LAN=DE A1 Chae, Dong-Hun A1 Kim, Mun-Seog A1 Kim, Wan-Seop A1 Oe, Takehiko A1 Kaneko, Nobu-Hisa YR 2020 SN 2160-0171 K1 Current measurement K1 Resistance K1 Voltage measurement K1 Electrical resistance measurement K1 Measurement uncertainty K1 Standards K1 Resistors K1 Gallium arsenide K1 Hall effect device K1 metrology K1 resistance K1 quantum mechanics SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/CPEM49742.2020.9191697 DO https://doi.org/10.1109/CPEM49742.2020.9191697 SF ELIB - SuUB Bremen
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