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1 Ergebnisse
1
VNA-Based Material Characterization in THz Domain without C..:
, In:
2020 Conference on Precision Electromagnetic Measurements (CPEM)
,
Kazemipour, Alireza
;
Hoffmann, Johannes
;
Wollensack, Michael
... - p. 1-2 , 2020
Link:
https://doi.org/10.1109/CPEM49742.2020.9191818
RT T1
2020 Conference on Precision Electromagnetic Measurements (CPEM)
: T1
VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating
UL https://suche.suub.uni-bremen.de/peid=ieee-9191818&Exemplar=1&LAN=DE A1 Kazemipour, Alireza A1 Hoffmann, Johannes A1 Wollensack, Michael A1 Allal, Djamel A1 Hudlicka, Martin A1 Ruefenacht, Juerg A1 Stalder, Daniel A1 Zeier, Markus YR 2020 SN 2160-0171 K1 Permittivity K1 Calibration K1 Metrology K1 Permittivity measurement K1 Uncertainty K1 Measurement uncertainty K1 Reliability K1 Material characterization K1 parameter extraction K1 VNA time-gating K1 RF metrology K1 measurement uncertainty SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/CPEM49742.2020.9191818 DO https://doi.org/10.1109/CPEM49742.2020.9191818 SF ELIB - SuUB Bremen
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