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1 Ergebnisse
1
Directly Comparing the Current from Two Electron Pumps:
, In:
2020 Conference on Precision Electromagnetic Measurements (CPEM)
,
Giblin, S. P.
;
Yamahata, G.
;
Fujiwara, A.
... - p. 1-2 , 2020
Link:
https://doi.org/10.1109/CPEM49742.2020.9191837
RT T1 <cTitle>2020 Conference on Precision Electromagnetic Measurements (CPEM)</cTitle>: T1 <Title>Directly Comparing the Current from Two Electron Pumps</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9191837&Exemplar=1&LAN=DE A1 Giblin, S. P. A1 Yamahata, G. A1 Fujiwara, A. A1 See, P. A1 Griffiths, J. P. A1 Jones, G. A. C. A1 Farrer, I. A1 Ritchie, D. A. A1 Kataoka, M. YR 2020 SN 2160-0171 K1 Temperature measurement K1 Current measurement K1 Logic gates K1 Silicon K1 Radio frequency K1 Noise measurement K1 Preamplifiers K1 calibration K1 current measurement K1 metrology K1 semiconductor nanostructures K1 single electron devices SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/CPEM49742.2020.9191837 DO https://doi.org/10.1109/CPEM49742.2020.9191837 SF ELIB - SuUB Bremen
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