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1 Ergebnisse
1
Extending the Calibration Capabilities of High Resistance:
, In:
2020 Conference on Precision Electromagnetic Measurements (CPEM)
,
Schumacher, B.
;
Rohrig, C.
- p. 1-2 , 2020
Link:
https://doi.org/10.1109/CPEM49742.2020.9191915
RT T1 <cTitle>2020 Conference on Precision Electromagnetic Measurements (CPEM)</cTitle>: T1 <Title>Extending the Calibration Capabilities of High Resistance</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9191915&Exemplar=1&LAN=DE A1 Schumacher, B. A1 Rohrig, C. YR 2020 SN 2160-0171 K1 Resistors K1 Calibration K1 Resistance K1 Voltage measurement K1 Standards K1 Uncertainty K1 Current measurement K1 Resistance measurement K1 measurement techniques K1 cryogenic current comparator K1 precision measurements K1 uncertainty SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/CPEM49742.2020.9191915 DO https://doi.org/10.1109/CPEM49742.2020.9191915 SF ELIB - SuUB Bremen
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